Semiconductor Manufacturing
MIT's 6.780 covers the statistical modeling and control methods used to run semiconductor fabrication plants. The course works through design of experiments, response surface modeling, and process optimization, then moves into defect and parametric yield modeling and yield optimization across process, device, and circuit levels. Later sessions cover monitoring, diagnosis, and feedback control of fabrication equipment and processes, plus the analysis and scheduling of manufacturing operations on the fab floor. Materials come from MIT OpenCourseWare and include lecture notes, assignments, and readings aimed at students who already have a background in semiconductor devices or manufacturing. The course is free to audit, with no certificate offered through OCW. It suits engineers and students who want the quantitative tools behind running a fab rather than an introduction to chip design itself.